Keyword Secondary ion mass spectrometry (SIMS) | Collection of Czechoslovak Chemical Communications

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Secondary ion mass spectrometry (SIMS)

Veronika Vidová, Michael Volný, Karel Lemr and Vladimír Havlíček*
Surface analysis by imaging mass spectrometry
2009, Vol. 74, Issue 7-8, pp. 1101–1116 [Abstract]